aarch64: Remove XFAILs for two SVE tests
These tests started passing a while ago, so remove the XFAILs. gcc/testsuite/ * gcc.target/aarch64/sve/cond_cnot_1.c: Remove XFAIL. * gcc.target/aarch64/sve/cond_unary_1.c: Likewise.
This commit is contained in:
parent
fcd513df9a
commit
0f6759240f
|
@ -31,5 +31,4 @@ TEST_ALL (DEF_LOOP)
|
|||
|
||||
/* { dg-final { scan-assembler-not {\tmov\tz} } } */
|
||||
/* { dg-final { scan-assembler-not {\tmovprfx\t} } } */
|
||||
/* Currently we canonicalize the ?: so that !b[i] is the "false" value. */
|
||||
/* { dg-final { scan-assembler-not {\tsel\t} { xfail *-*-* } } } */
|
||||
/* { dg-final { scan-assembler-not {\tsel\t} } } */
|
||||
|
|
|
@ -54,6 +54,4 @@ TEST_ALL (DEF_LOOP)
|
|||
|
||||
/* { dg-final { scan-assembler-not {\tmov\tz} } } */
|
||||
/* { dg-final { scan-assembler-not {\tmovprfx\t} } } */
|
||||
/* XFAILed because the ?: gets canonicalized so that the operation is in
|
||||
the false arm. */
|
||||
/* { dg-final { scan-assembler-not {\tsel\t} { xfail *-*-* } } } */
|
||||
/* { dg-final { scan-assembler-not {\tsel\t} } } */
|
||||
|
|
Loading…
Reference in New Issue