OpenE2K
/
linux
6
0
Fork 0
Code Issues Pull Requests Releases Wiki Activity

media: ov5640: Disable transparent feature for test pattern 

The transparent feature for test patterns blends the test pattern with
an actual captured image. This makes the result non-static, subject to
changes in the sensor's field of view.

Test patterns should be predictable and deterministic, even if they are
dynamic patterns. Disable the transparent feature of the test pattern.

Signed-off-by: Chen-Yu Tsai <wens@csie.org>
Signed-off-by: Sakari Ailus <sakari.ailus@linux.intel.com>
Signed-off-by: Mauro Carvalho Chehab <mchehab+samsung@kernel.org>
This commit is contained in:
Chen-Yu Tsai 2019-01-18 03:52:03 -05:00 committed by Mauro Carvalho Chehab
parent a0c29afb50
commit 2aff1fc365
1 changed files with 1 additions and 2 deletions
Show Stats Download Patch File Download Diff File Expand all files Collapse all files

3
drivers/media/i2c/ov5640.c
View File

@ -2461,8 +2461,7 @@ static const char * const test_pattern_menu[] = {
static const u8 test_pattern_val[] = {
0,
OV5640_TEST_ENABLE | OV5640_TEST_TRANSPARENT |
OV5640_TEST_BAR_VERT_CHANGE_1 |
OV5640_TEST_ENABLE | OV5640_TEST_BAR_VERT_CHANGE_1 |
OV5640_TEST_BAR,
};