Commit Graph

9 Commits

Author SHA1 Message Date
David Woodhouse 647b0d3854 [MTD] [TESTS] Fix some size_t printk format warnings
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
2009-01-05 16:31:03 +00:00
Artem Bityutskiy 9faa8153be MTD: add MTD tests to compilation
Add MTD tests to Kconfig and Makefiles.

Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
2008-12-10 17:00:44 +02:00
Artem Bityutskiy 4db451a764 MTD: tests: add mtd_torturetest
This test is designed to work for very long time and it tries to
wear few eraseblocks.

Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
2008-12-10 17:00:40 +02:00
Artem Bityutskiy bf60862a58 MTD: tests: add mtd_subpagetest
This tests makes sure sub-pages on NAND MTD device work fine.

Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
2008-12-08 13:56:14 +02:00
Artem Bityutskiy 7163cea15f MTD: tests: add mtd_stresstest
This test just performs random operations on random eraseblocks.

Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
2008-12-08 13:56:14 +02:00
Artem Bityutskiy 72069be936 MTD: tests: add mtd_speedtest
This test examines I/O speed of the flash device.

Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
2008-12-08 13:56:14 +02:00
Artem Bityutskiy 72091b6889 MTD: tests: add mtd_readtest
A simple tests which reads whole MTD device one page at a time.

Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
2008-12-08 13:56:14 +02:00
Artem Bityutskiy e73f217439 MTD: tests: add mtd_pagetest
This test checks that NAND pages read/write work fine.

Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
2008-12-08 13:56:14 +02:00
Artem Bityutskiy e3644da756 MTD: tests: add mtd_oobtest
This test checks that OOB of a NAND MTD device works fine.

Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
2008-12-08 13:56:13 +02:00