Commit Graph

4 Commits

Author SHA1 Message Date
Akinobu Mita a995c79228 mtd: tests: rename sources in order to link a helper object
Each mtd test module have a single source whose name is the same as
the module name.  In order to link a single object including helper
functions to every test module, this rename these sources to the
different names.

Signed-off-by: Akinobu Mita <akinobu.mita@gmail.com>
Cc: Brian Norris <computersforpeace@gmail.com>
Cc: Vikram Narayanan <vikram186@gmail.com>
Cc: Adrian Hunter <adrian.hunter@intel.com>
Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
2013-08-30 21:34:06 +01:00
Iwo Mergler 3cf06f4f85 mtd: tests: test for multi-bit error correction
This tests ECC biterror recovery on a single NAND page. Mostly intended
to test ECC hardware and low-level NAND driver.

There are two test modes:

    0 - artificially inserting bit errors until the ECC fails
        This is the default method and fairly quick. It should
        be independent of the quality of the FLASH.

    1 - re-writing the same pattern repeatedly until the ECC fails.
        This method relies on the physics of NAND FLASH to eventually
        generate '0' bits if '1' has been written sufficient times. Depending
        on the NAND, the first bit errors will appear after 1000 or
        more writes and then will usually snowball, reaching the limits
        of the ECC quickly.

The test stops after 10000 cycles, should your FLASH be exceptionally
good and not generate bit errors before that. Try a different page
offset in that case.

Please note that neither of these tests will significantly 'use up' any FLASH
endurance. Only a maximum of two erase operations will be performed.

Signed-off-by: Iwo Mergler <Iwo.Mergler@netcommwireless.com.au>
Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
2012-09-29 15:46:58 +01:00
Akinobu Mita 7126bd8be4 mtd: add nand_ecc test module
This module tests NAND ECC functions.

The test is simple.

1. Create a 256 or 512 bytes block of data filled with random bytes (data)
2. Duplicate the data block and inject single bit error (error_data)
3. Try to correct error_data
4. Compare data and error_data

Signed-off-by: Akinobu Mita <akinobu.mita@gmail.com>
Acked-by: Vimal Singh <vimalsingh@ti.com>
Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
2009-11-30 09:41:49 +00:00
Artem Bityutskiy 9faa8153be MTD: add MTD tests to compilation
Add MTD tests to Kconfig and Makefiles.

Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
2008-12-10 17:00:44 +02:00