bafe030832
These events include a copy of the device health information at the time of the event. Actually using the emulated device health would require a lot of controls to manipulate that state. Given the aim of this injection code is to just test the flows when events occur, inject the contents of the device health state as well. Future work may add more sophisticate device health emulation including direct generation of these records when events occur (such as a temperature threshold being crossed). That does not reduce the usefulness of this more basic generation of the events. Acked-by: Markus Armbruster <armbru@redhat.com> Reviewed-by: Fan Ni <fan.ni@samsung.com> Reviewed-by: Ira Weiny <ira.weiny@intel.com> Signed-off-by: Jonathan Cameron <Jonathan.Cameron@huawei.com> Message-Id: <20230530133603.16934-8-Jonathan.Cameron@huawei.com> Reviewed-by: Michael S. Tsirkin <mst@redhat.com> Signed-off-by: Michael S. Tsirkin <mst@redhat.com> |
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| .. | ||
| cxl_type3_stubs.c | ||
| cxl_type3.c | ||
| Kconfig | ||
| memory-device.c | ||
| meson.build | ||
| npcm7xx_mc.c | ||
| nvdimm.c | ||
| pc-dimm.c | ||
| sparse-mem.c | ||
| trace-events | ||
| trace.h | ||